DM750 M Binocular materials microscope
DM750 M Binocular materials microscope
The Leica DM750 M Binocular Materials Microscope is designed for materials science education, metallography, and routine industrial inspection. Its versatile stage supports both transmitted and reflected light observations, while the integrated LED reflected light illuminator offers brightfield, polarized, and oblique illumination for examining a wide range of materials. Compatible with various specimen holders, the DM750 M delivers high-quality imaging for metals, alloys, polymers, and other industrial samples, making it an ideal choice for laboratories, universities, and quality control applications.
Key Features
- Designed for metallography and materials science
- Supports transmitted and reflected light microscopy
- Brightfield, polarized, and oblique LED illumination
- Versatile stage with interchangeable specimen holders
- High-quality optical performance
- Ideal for industrial laboratories, education, and quality inspection
- Ergonomic and easy-to-use design

Technical Specifications
System Specifications
| Specification | Details |
|---|---|
| Stand | Die-cast aluminum construction with protected controls, adjustable Koehler field diaphragm, centerable/focusable condenser mount, and external fuses |
| Reflected Light Axis | 4-segment LED illumination for brightfield, oblique, and polarization contrast; adjustable aperture diaphragm and removable beam splitter |
| Membrane Keyboard Control | 3-LED segment illumination direction control, LED intensity adjustment, and power on/off switch |
| Polarized Light | Dedicated polarizer/analyzer slot for polarized light applications |
| Transmitted Light | Built-in LED illumination with 25,000-hour lifetime, Koehler field diaphragm, optional Abbe condenser (NA 0.9), and continuous intensity adjustment |
| Eyepieces | High-eyepoint 10×/20 eyepieces, crosshair and focusing options, foldable eyeguards, 30 mm mounting diameter |
| Stage | Integrated coaxial X/Y drive, 185 × 140 mm stage surface, sample-holder compatibility, rounded edges, non-extending rack, and wear-resistant surface |
| Special Sample Holders | Stage wells for 1-inch samples and samples up to 30 mm height |
| Objectives | Infinity platform with HI PLAN or N PLAN objectives and laser-engraved labeling; M25 nosepiece thread |
| Focus | Low-position focus controls, self-adjusting mechanism, 300 µm per fine-focus rotation, 3 µm increments, and weighted focus knobs |
| Imaging | Trinocular tubes with 50%/50% light split, C-mount adapters, and compatibility with Leica cameras |
| EZSTORE™ | Vertical handle, front stand undercut, cord wrap, and vertical cord attachment |
| AGTREAT™ | Anti-microbial surface treatment |



